Frontiers of characterization and metrology for nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Gaithersburg, Maryland, 27-29 March 2007

Basic information on record for this barcode. Check its recall status and where to find it below.

Barcode (EAN/GTIN)	9780735404410
Brand	American Institute of Physics
Category	integrated circuits -- ultra large scale integration -- congresses
GS1 registrant	International ISBN Agency (ISBN (Books))

🟢 No active recalls on file · Checked against EU Safety Gate, US FDA, US CPSC and Health Canada datasets (2026-07-15).

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